AOI

SWIRE R45 Reel-To-Reel AOI

  • 2x SWIR station and 1x visible light simultaneous inspection to hidden silicon defect detection
  • Capable of inspecting bare silicon & penetrable back coating
  • Tape width 8, 12, 16, 24mm, pocket pitch 2, 4, 8, 12mm
  • Patented tape levelling module
  • 7” and 13” reel
Items Specification
Camera
2x 5.32 MP SWIR camera (industry’s highest resolution), 1x 12 MP visible light camera (optional)
Lens
High- magnification microscope
Light Source
Internal coaxial shortwave infrared light source
FOV
3.53 mm x 2.83 mm
Resolution
1.38um / pixel
Depth of field
±6.8um
Working Distance
10mm
Focus
Patented ultra-high-speed auto-focus solution
Inspection Method
AOI + Deep learning
UPH
> 45K (1x1mm)
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